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1 Ergebnisse
1
M-type Cathode Emission Degradation Simulation based on Sur..:
, In:
2022 23rd International Vacuum Electronics Conference (IVEC)
,
Fan, Hehong
;
Sun, Wenrui
;
Tang, Shuai
.. - p. 240-241 , 2022
Link:
https://doi.org/10.1109/IVEC53421.2022.10292400
RT T1 <cTitle>2022 23rd International Vacuum Electronics Conference (IVEC)</cTitle>: T1 <Title>M-type Cathode Emission Degradation Simulation based on Surface Coating Degradation Mechanisms</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10292400&Exemplar=1&LAN=DE A1 Fan, Hehong A1 Sun, Wenrui A1 Tang, Shuai A1 Wei, Ying A1 Sun, Xiaohan YR 2022 K1 Degradation K1 Performance evaluation K1 Simulation K1 Measurement uncertainty K1 Failure analysis K1 Vacuum electronics K1 Coatings K1 failure mechanism K1 M-type cathode K1 interdiffusion K1 ion-bombardment SP 240 OP 241 LK http://dx.doi.org/https://doi.org/10.1109/IVEC53421.2022.10292400 DO https://doi.org/10.1109/IVEC53421.2022.10292400 SF ELIB - SuUB Bremen
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