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1 Ergebnisse
1
An IGBT Device Health Status Assessment Method Considering ..:
, In:
2023 IEEE/IAS Industrial and Commercial Power System Asia (I&CPS Asia)
,
Yang, Cheng
;
Duan, Zeyu
;
Yao, Ran
... - p. 1258-1263 , 2023
Link:
https://doi.org/10.1109/ICPSAsia58343.2023.10294902
RT T1 <cTitle>2023 IEEE/IAS Industrial and Commercial Power System Asia (I&CPS Asia)</cTitle>: T1 <Title>An IGBT Device Health Status Assessment Method Considering the Influence of Operating Conditions</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10294902&Exemplar=1&LAN=DE A1 Yang, Cheng A1 Duan, Zeyu A1 Yao, Ran A1 Li, Hui A1 Lai, Wei A1 Min, Yuan A1 Yuan, Yannan A1 Han, Wenxing YR 2023 K1 Insulated gate bipolar transistors K1 Analytical models K1 Adaptive systems K1 Simulation K1 Neural networks K1 Voltage K1 Predictive models K1 Health status assessment K1 insulated gate Bipolar transistor (IGBT) K1 finite element model(FEM) SP 1258 OP 1263 LK http://dx.doi.org/https://doi.org/10.1109/ICPSAsia58343.2023.10294902 DO https://doi.org/10.1109/ICPSAsia58343.2023.10294902 SF ELIB - SuUB Bremen
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