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1 Ergebnisse
1
PCB bare board defect detection based on improved YOLOv5s:
, In:
2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)
,
Jin, Yuxin
;
Cai, Lecai
;
Cheng, Kui
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/SAFEPROCESS58597.2023.10295682
RT T1
2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)
: T1
PCB bare board defect detection based on improved YOLOv5s
UL https://suche.suub.uni-bremen.de/peid=ieee-10295682&Exemplar=1&LAN=DE A1 Jin, Yuxin A1 Cai, Lecai A1 Cheng, Kui A1 Wang, Xinjie A1 Luo, Chunlan A1 Jiao, Sanxiu YR 2023 K1 Location awareness K1 Convolution K1 Shape K1 Semantics K1 Printed circuits K1 Inspection K1 Feature extraction K1 PCB K1 YOLOv5s K1 BiFPN K1 Biformer K1 ODConv K1 Target Detection K1 Defect Detection K1 Non-destructive testing SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/SAFEPROCESS58597.2023.10295682 DO https://doi.org/10.1109/SAFEPROCESS58597.2023.10295682 SF ELIB - SuUB Bremen
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