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1 Ergebnisse
1
When Less is Enough: Positive and Unlabeled Learning Model ..:
, In:
2023 38th IEEE/ACM International Conference on Automated Software Engineering (ASE)
,
Wen, Xin-Cheng
;
Wang, Xinchen
;
Gao, Cuiyun
... - p. 345-357 , 2023
Link:
https://doi.org/10.1109/ASE56229.2023.00144
RT T1 <cTitle>2023 38th IEEE/ACM International Conference on Automated Software Engineering (ASE)</cTitle>: T1 <Title>When Less is Enough: Positive and Unlabeled Learning Model for Vulnerability Detection</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10298363&Exemplar=1&LAN=DE A1 Wen, Xin-Cheng A1 Wang, Xinchen A1 Gao, Cuiyun A1 Wang, Shaohua A1 Liu, Yang A1 Gu, Zhaoquan YR 2023 SN 2643-1572 K1 Representation learning K1 Measurement K1 Deep learning K1 Codes K1 Source coding K1 Prototypes K1 Benchmark testing K1 Software vulnerability detection K1 positive and unlabeled learning K1 source code representation SP 345 OP 357 LK http://dx.doi.org/https://doi.org/10.1109/ASE56229.2023.00144 DO https://doi.org/10.1109/ASE56229.2023.00144 SF ELIB - SuUB Bremen
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