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1 Ergebnisse
1
Scattering-type Near-Field Optical Microscopy Characterizat..:
, In:
2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
,
Johnson, D.
;
Vincent, T.
;
Liu, X.
... - p. 1-2 , 2023
Link:
https://doi.org/10.1109/IRMMW-THz57677.2023.10299204
RT T1
2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
: T1
Scattering-type Near-Field Optical Microscopy Characterization of Topological Insulator Bi2Te3 nanowires
UL https://suche.suub.uni-bremen.de/peid=ieee-10299204&Exemplar=1&LAN=DE A1 Johnson, D. A1 Vincent, T. A1 Liu, X. A1 Gholizadeh, B. A1 Schoenherr, P. A1 Hesjedal, T. A1 Kazakova, O. A1 Huang, N. A1 Boland, J. YR 2023 SN 2162-2035 K1 Optical microscopy K1 Microscopy K1 Optical imaging K1 Optical coupling K1 Nanowires K1 Topological insulators K1 Optical scattering SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/IRMMW-THz57677.2023.10299204 DO https://doi.org/10.1109/IRMMW-THz57677.2023.10299204 SF ELIB - SuUB Bremen
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