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1 Ergebnisse
1
A Design of Source-Switched Charge Pump Circuit with 65nm T..:
, In:
2023 International Symposium on Electrical and Electronics Engineering (ISEE)
,
Tran, Phuc Thanh
;
Hoang Luu, Long
;
Van Nguyen, Giang
.. - p. 35-40 , 2023
Link:
https://doi.org/10.1109/ISEE59483.2023.10299853
RT T1 <cTitle>2023 International Symposium on Electrical and Electronics Engineering (ISEE)</cTitle>: T1 <Title>A Design of Source-Switched Charge Pump Circuit with 65nm Technology by using Bayesian Optimization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10299853&Exemplar=1&LAN=DE A1 Tran, Phuc Thanh A1 Hoang Luu, Long A1 Van Nguyen, Giang A1 Quoc Nguyen, Thang A1 Hoang, Trang YR 2023 K1 Integrated circuits K1 Charge pumps K1 Power demand K1 Jitter K1 Bayes methods K1 Topology K1 Transistors K1 Bayesian Optimization K1 Source-switched charge pump K1 Power consumption optimization SP 35 OP 40 LK http://dx.doi.org/https://doi.org/10.1109/ISEE59483.2023.10299853 DO https://doi.org/10.1109/ISEE59483.2023.10299853 SF ELIB - SuUB Bremen
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