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1 Ergebnisse
1
BDD-Based Self-Test Program Generation for Processor Cores:
, In:
2023 IEEE International Test Conference in Asia (ITC-Asia)
,
Cheng, Hao
;
Li, Chi-Jhe
;
Chen, Hung-Lin
. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ITC-Asia58802.2023.10301167
RT T1
2023 IEEE International Test Conference in Asia (ITC-Asia)
: T1
BDD-Based Self-Test Program Generation for Processor Cores
UL https://suche.suub.uni-bremen.de/peid=ieee-10301167&Exemplar=1&LAN=DE A1 Cheng, Hao A1 Li, Chi-Jhe A1 Chen, Hung-Lin A1 Huang, Jiun-Lang YR 2023 SN 2768-069X K1 Fault detection K1 Mission critical systems K1 Built-in self-test K1 Electrical fault detection K1 Registers K1 Delays K1 Complexity theory K1 software-based self-test K1 processor K1 in-field testing K1 binary decision diagram K1 reliability SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ITC-Asia58802.2023.10301167 DO https://doi.org/10.1109/ITC-Asia58802.2023.10301167 SF ELIB - SuUB Bremen
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