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BDD-Based Self-Test Program Generation for Processor Cores:

, In: 2023 IEEE International Test Conference in Asia (ITC-Asia),
Cheng, Hao ; Li, Chi-Jhe ; Chen, Hung-Lin. - p. 1-6 , 2023
Link: https://doi.org/10.1109/ITC-Asia58802.2023.10301167