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Design of A Highly Reliable and Low-Power SRAM With Double-..:

, In: 2023 IEEE International Test Conference in Asia (ITC-Asia),
Yan, Aibin ; Xiang, Jing ; Huang, Zhengfeng... - p. 1-6 , 2023
Link: https://doi.org/10.1109/ITC-Asia58802.2023.10301170