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Fault-Aware ECC Scheme for Enhancing the Read Reliability o..:

, In: 2023 IEEE International Test Conference in Asia (ITC-Asia),
Wu, Meng-Shan ; Chua, Yen-Lin ; Li, Jin-Fu.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/ITC-Asia58802.2023.10301173