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1 Ergebnisse
1
Design of a Novel Latch with Quadruple-Node-Upset Recovery ..:
, In:
2023 IEEE International Test Conference in Asia (ITC-Asia)
,
Yan, Aibin
;
Zhou, Chao
;
Wei, Shaojie
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ITC-Asia58802.2023.10301187
RT T1
2023 IEEE International Test Conference in Asia (ITC-Asia)
: T1
Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness
UL https://suche.suub.uni-bremen.de/peid=ieee-10301187&Exemplar=1&LAN=DE A1 Yan, Aibin A1 Zhou, Chao A1 Wei, Shaojie A1 Cui, Jie A1 Huang, Zhengfeng A1 Girard, Patrick A1 Wen, Xiaoqing YR 2023 SN 2768-069X K1 Fault tolerance K1 Latches K1 Radiation hardening (electronics) K1 Simulation K1 Fault tolerant systems K1 CMOS process K1 Inverters K1 Radiation hardening K1 fault tolerance K1 multiple-node upset K1 quadruple-node upset SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ITC-Asia58802.2023.10301187 DO https://doi.org/10.1109/ITC-Asia58802.2023.10301187 SF ELIB - SuUB Bremen
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