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1 Ergebnisse
1
Low-field Mobility Degradation Factors Temperature Dependen..:
, In:
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)
,
Rodrigues, Jaime Calcade
;
Casse, Mikael
;
Barraud, Sylvain
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/SBMicro60499.2023.10302471
RT T1
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)
: T1
Low-field Mobility Degradation Factors Temperature Dependence in Two-level Stacked Nanowire MOSFETs from 120K to 400K
UL https://suche.suub.uni-bremen.de/peid=ieee-10302471&Exemplar=1&LAN=DE A1 Rodrigues, Jaime Calcade A1 Casse, Mikael A1 Barraud, Sylvain A1 Vinet, Maud A1 Faynot, Olivier A1 Pavanello, Marcelo Antonio YR 2023 SN 2832-4218 K1 Degradation K1 Geometry K1 Temperature distribution K1 MOSFET K1 Temperature dependence K1 Voltage K1 Logic gates K1 2-level stacked nanosheets K1 MOSFETs K1 Electrical Characterization K1 Low-temperature SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/SBMicro60499.2023.10302471 DO https://doi.org/10.1109/SBMicro60499.2023.10302471 SF ELIB - SuUB Bremen
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