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Experimental Comparison of Threshold Voltage Extraction Met..:
, In:
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)
,
Prates, Vinicius Rodrigues
;
Pavanello, Marcelo Antonio
;
de Souza, Michelly
- p. 1-4 , 2023
Link:
https://doi.org/10.1109/SBMicro60499.2023.10302588
RT T1
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)
: T1
Experimental Comparison of Threshold Voltage Extraction Methods in SOI Nanowire Transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-10302588&Exemplar=1&LAN=DE A1 Prates, Vinicius Rodrigues A1 Pavanello, Marcelo Antonio A1 de Souza, Michelly YR 2023 SN 2832-4218 K1 Temperature measurement K1 MOSFET K1 Current measurement K1 Length measurement K1 Threshold voltage K1 Nanoscale devices K1 Microelectronics K1 threshold voltage K1 nanowire transistors K1 SOI K1 electrical characterization K1 high temperature SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/SBMicro60499.2023.10302588 DO https://doi.org/10.1109/SBMicro60499.2023.10302588 SF ELIB - SuUB Bremen
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