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1 Ergebnisse
1
Study of the effect of multiple conductions on threshold vo..:
, In:
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)
,
Perina, Welder F.
;
Martino, Joao A.
;
Simoen, Eddy
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/SBMicro60499.2023.10302604
RT T1
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)
: T1
Study of the effect of multiple conductions on threshold voltage in a MIS-HEMT from 450 K down to 200 K
UL https://suche.suub.uni-bremen.de/peid=ieee-10302604&Exemplar=1&LAN=DE A1 Perina, Welder F. A1 Martino, Joao A. A1 Simoen, Eddy A1 Peralagu, Uthayasankaran A1 Collaert, Nadine A1 Agopian, Paula G. D. YR 2023 SN 2832-4218 K1 Temperature distribution K1 Logic gates K1 HEMTs K1 Threshold voltage K1 Behavioral sciences K1 Microelectronics K1 MODFETs K1 MISHEMT K1 basic parameters K1 temperature K1 heterostructure K1 GaN K1 threshold voltage SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/SBMicro60499.2023.10302604 DO https://doi.org/10.1109/SBMicro60499.2023.10302604 SF ELIB - SuUB Bremen
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