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1
Structural and Dielectric Properties of Laser Crystallized ..:
, In:
2023 International Workshop on Impedance Spectroscopy (IWIS)
,
S, Akhil Raman T
;
Joseph, Andrews
;
B, Arun
... - p. 135-137 , 2023
Link:
https://doi.org/10.1109/IWIS61214.2023.10302775
RT T1 <cTitle>2023 International Workshop on Impedance Spectroscopy (IWIS)</cTitle>: T1 <Title>Structural and Dielectric Properties of Laser Crystallized BST Thin Films for Microwave Device Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10302775&Exemplar=1&LAN=DE A1 S, Akhil Raman T A1 Joseph, Andrews A1 B, Arun A1 K, Suresh E A1 Chedurupalli, Shivakumar A1 C, James Raju K YR 2023 K1 Temperature measurement K1 Annealing K1 Temperature K1 X-ray scattering K1 Films K1 Measurement by laser beam K1 Masers K1 low temperature crystallization K1 Laser annealing K1 ferroelectric thin films K1 dielectric tunability SP 135 OP 137 LK http://dx.doi.org/https://doi.org/10.1109/IWIS61214.2023.10302775 DO https://doi.org/10.1109/IWIS61214.2023.10302775 SF ELIB - SuUB Bremen
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