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1 Ergebnisse
1
Si Nanowires-holes Arrays with Enhanced Wettability:
, In:
2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
,
Saeed, Sadaf
;
Zia, Ali
;
Liu, Ri
... - p. 9-12 , 2023
Link:
https://doi.org/10.1109/3M-NANO58613.2023.10305304
RT T1 <cTitle>2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)</cTitle>: T1 <Title>Si Nanowires-holes Arrays with Enhanced Wettability</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10305304&Exemplar=1&LAN=DE A1 Saeed, Sadaf A1 Zia, Ali A1 Liu, Ri A1 Liu, Dongdong A1 Cao, Liang A1 Wang, Zuobin YR 2023 SN 2694-510X K1 Scanning electron microscopy K1 Surface engineering K1 Lithography K1 Surface morphology K1 Surface emitting lasers K1 Interference K1 Silicon K1 nanostructured Si nanowires-holes (NWs-NHs) arrays K1 wettability K1 two-beam laser interference lithography SP 9 OP 12 LK http://dx.doi.org/https://doi.org/10.1109/3M-NANO58613.2023.10305304 DO https://doi.org/10.1109/3M-NANO58613.2023.10305304 SF ELIB - SuUB Bremen
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