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Optical Super-resolution Diagnostics: A Review of Sub-wavel..:

, In: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO),

Bryanston-Cross, Peter ; Judge, Thomas ; Wang, Zuobin - p. 18-24 , 2023

Link: https://doi.org/10.1109/3M-NANO58613.2023.10305320

RT 
T1 <cTitle>2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)</cTitle>: T1 <Title>Optical Super-resolution Diagnostics: A Review of Sub-wavelength Measurements and Applications</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10305320&Exemplar=1&LAN=DE
				
A1 Bryanston-Cross, Peter
A1 Judge, Thomas
A1 Wang, Zuobin
YR 2023
SN 2694-510X
K1 Optical diffraction
K1 Image resolution
K1 Optical microscopy
K1 Biomedical optical imaging
K1 Diffraction
K1 Microscopy
K1 Superresolution
K1 Holographic Diffraction Imaging Microscope (HDIM)
K1 Olympus Microscope Spinning Disc (OSM)
K1 Ptychographic Illumination Microscopy (PIM)
K1 Stimulated Emission Depletion (STED) Microscopy
K1 Stochastic Optical Reconstruction Microscopy (STORM)
K1 Photoactivated Localisation Microscopy (PALM)
SP 18
OP 24
LK http://dx.doi.org/https://doi.org/10.1109/3M-NANO58613.2023.10305320
DO https://doi.org/10.1109/3M-NANO58613.2023.10305320
SF ELIB - SuUB Bremen

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