I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
IR Cut-off Film of Target Microsttucture Surface Scattering..:
, In:
2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
,
Wu, Boqi
;
Chi, Yaodan
;
Zhao, Yang
... - p. 285-289 , 2023
Link:
https://doi.org/10.1109/3M-NANO58613.2023.10305349
RT T1 <cTitle>2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)</cTitle>: T1 <Title>IR Cut-off Film of Target Microsttucture Surface Scattering Parameters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10305349&Exemplar=1&LAN=DE A1 Wu, Boqi A1 Chi, Yaodan A1 Zhao, Yang A1 Dong, Zhengyan A1 Zhang, Hengxu A1 Gao, Rongting YR 2023 SN 2694-510X K1 Reflectivity K1 Temperature distribution K1 Surface waves K1 Simulated annealing K1 Filtering theory K1 Scattering parameters K1 Microstructure K1 target microstructure surface scattering parameters K1 IR cut-off film K1 simulated annealing algorithm K1 film process improvement SP 285 OP 289 LK http://dx.doi.org/https://doi.org/10.1109/3M-NANO58613.2023.10305349 DO https://doi.org/10.1109/3M-NANO58613.2023.10305349 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
