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1 Ergebnisse
1
A method to Solve the Influence of Local High Temperature o..:
, In:
2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
,
Zhuang, Yaming
;
Liu, Xianchao
;
Liu, Yang
... - p. 176-179 , 2023
Link:
https://doi.org/10.1109/3M-NANO58613.2023.10305371
RT T1 <cTitle>2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)</cTitle>: T1 <Title>A method to Solve the Influence of Local High Temperature on Automatic Focusing of Infrared Imaging</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10305371&Exemplar=1&LAN=DE A1 Zhuang, Yaming A1 Liu, Xianchao A1 Liu, Yang A1 Wang, Qian A1 Dai, Jun A1 Chen, Xiang A1 Liu, Xiangyun A1 Qiu, Juncheng A1 Fan, Chengbo YR 2023 SN 2694-510X K1 Gradient methods K1 Machine vision K1 Focusing K1 Fires K1 Infrared imaging K1 Tail K1 Gray-scale K1 SOBEL operator K1 focus K1 grayscale average assistance SP 176 OP 179 LK http://dx.doi.org/https://doi.org/10.1109/3M-NANO58613.2023.10305371 DO https://doi.org/10.1109/3M-NANO58613.2023.10305371 SF ELIB - SuUB Bremen
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