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1 Ergebnisse
1
Extraction of Material Properties of A Thin Silicon Membran..:
, In:
2023 IEEE International Ultrasonics Symposium (IUS)
,
Ghosh, Sagnik
;
Ramegowda, Prakasha Chigahalli
;
Jian Goh, Duan
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IUS51837.2023.10306882
RT T1
2023 IEEE International Ultrasonics Symposium (IUS)
: T1
Extraction of Material Properties of A Thin Silicon Membrane Embedded in A Piezoelectric Stack
UL https://suche.suub.uni-bremen.de/peid=ieee-10306882&Exemplar=1&LAN=DE A1 Ghosh, Sagnik A1 Ramegowda, Prakasha Chigahalli A1 Jian Goh, Duan A1 Sharma, Jaibir A1 Koh, Yul A1 Lee, Joshua E.-Y. YR 2023 SN 1948-5727 K1 Semiconductor device modeling K1 Solid modeling K1 Three-dimensional displays K1 Sensitivity K1 Resonant frequency K1 Doping K1 Scandium K1 Piezoelectric-on-silicon resonator K1 elastic constant of heavily doped silicon K1 thickness extensional mode K1 thin silicon membrane K1 material property extraction SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IUS51837.2023.10306882 DO https://doi.org/10.1109/IUS51837.2023.10306882 SF ELIB - SuUB Bremen
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