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Heavy Ion-Induced Damage in SiC Power MOSFETs with differen..:

, In: 2023 2nd International Conference on Advanced Electronics, Electrical and Green Energy (AEEGE),
He, Yufu ; Xu, Hongyi ; Ren, Na. - p. 36-40 , 2023
Link: https://doi.org/10.1109/AEEGE58828.2023.00015