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1 Ergebnisse
1
10-bit Area-reduced DAC for EIT Applications Using 180 nm T..:
, In:
2023 IEEE Seventh Ecuador Technical Chapters Meeting (ECTM)
,
Kuribara, Vitor O.
;
Junior, Marcus H. V.
;
Moreira, Luiz C.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ETCM58927.2023.10309058
RT T1
2023 IEEE Seventh Ecuador Technical Chapters Meeting (ECTM)
: T1
10-bit Area-reduced DAC for EIT Applications Using 180 nm Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-10309058&Exemplar=1&LAN=DE A1 Kuribara, Vitor O. A1 Junior, Marcus H. V. A1 Moreira, Luiz C. A1 Oliveira, Walter S. A1 Nascimento, Felipe F. A1 Sanches, Bruno C. de S. A1 Ponchet, Andre Da F. A1 Palacio, Jose A. A. A1 Van Noije, Wilhelmus A. M. YR 2023 K1 Electrical impedance tomography K1 Thermometers K1 Power demand K1 Digital-analog conversion K1 Linearity K1 Computer architecture K1 Frequency conversion K1 DAC K1 current-steering K1 EIT SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ETCM58927.2023.10309058 DO https://doi.org/10.1109/ETCM58927.2023.10309058 SF ELIB - SuUB Bremen
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