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1 Ergebnisse
1
Microstrip and Grounded CPW Calibration Kit Comparison for ..:
, In:
2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
,
Jones, Rob D.
;
Cheron, Jerome
;
Bosworth, Bryan T.
... - p. 124-127 , 2023
Link:
https://doi.org/10.1109/BCICTS54660.2023.10310853
RT T1 <cTitle>2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)</cTitle>: T1 <Title>Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10310853&Exemplar=1&LAN=DE A1 Jones, Rob D. A1 Cheron, Jerome A1 Bosworth, Bryan T. A1 Jamroz, Benjamin F. A1 Williams, Dylan F. A1 Urteaga, Miguel E. A1 Feldman, Ari D. A1 Aaen, Peter H. YR 2023 SN 2831-4999 K1 Semiconductor device measurement K1 Uncertainty K1 Measurement uncertainty K1 Calibration K1 Scattering parameters K1 Frequency measurement K1 Transistors K1 calibration K1 on-wafer K1 uncertainty K1 microstrip K1 coplanar waveguide K1 HBT K1 common emitter K1 common base K1 WR 3.4 SP 124 OP 127 LK http://dx.doi.org/https://doi.org/10.1109/BCICTS54660.2023.10310853 DO https://doi.org/10.1109/BCICTS54660.2023.10310853 SF ELIB - SuUB Bremen
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