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1 Ergebnisse
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Practical and Efficient Approaches to Device Modeling and P..:
, In:
2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
,
Rohdin, Hans
;
Jansen, Bart
;
Snodgrass, William
... - p. 16-23 , 2023
Link:
https://doi.org/10.1109/BCICTS54660.2023.10310879
RT T1
2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
: T1
Practical and Efficient Approaches to Device Modeling and Power Amplifier Module Design
UL https://suche.suub.uni-bremen.de/peid=ieee-10310879&Exemplar=1&LAN=DE A1 Rohdin, Hans A1 Jansen, Bart A1 Snodgrass, William A1 Kofol, J. Stephen A1 Nedeljkovic, Sonja A1 Chami, Ziad El A1 Sutton, Will A1 Dungan, Tom YR 2023 SN 2831-4999 K1 Temperature measurement K1 Temperature sensors K1 Semiconductor device modeling K1 Semiconductor device measurement K1 Bandwidth K1 Thermal management K1 Frequency measurement K1 Power amplifier K1 HBT K1 HEMT K1 simulation K1 optimization K1 ACPR K1 EVM K1 PAE K1 physical device model K1 model extraction K1 scaling K1 thermal resistance K1 envelop tracking K1 predistortion K1 FEM SP 16 OP 23 LK http://dx.doi.org/https://doi.org/10.1109/BCICTS54660.2023.10310879 DO https://doi.org/10.1109/BCICTS54660.2023.10310879 SF ELIB - SuUB Bremen
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