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Practical and Efficient Approaches to Device Modeling and P..:

, In: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),

Rohdin, Hans ; Jansen, Bart ; Snodgrass, William... - p. 16-23 , 2023

Link: https://doi.org/10.1109/BCICTS54660.2023.10310879

RT 
T1 <cTitle>2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)</cTitle>: T1 <Title>Practical and Efficient Approaches to Device Modeling and Power Amplifier Module Design</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10310879&Exemplar=1&LAN=DE
				
A1 Rohdin, Hans
A1 Jansen, Bart
A1 Snodgrass, William
A1 Kofol, J. Stephen
A1 Nedeljkovic, Sonja
A1 Chami, Ziad El
A1 Sutton, Will
A1 Dungan, Tom
YR 2023
SN 2831-4999
K1 Temperature measurement
K1 Temperature sensors
K1 Semiconductor device modeling
K1 Semiconductor device measurement
K1 Bandwidth
K1 Thermal management
K1 Frequency measurement
K1 Power amplifier
K1 HBT
K1 HEMT
K1 simulation
K1 optimization
K1 ACPR
K1 EVM
K1 PAE
K1 physical device model
K1 model extraction
K1 scaling
K1 thermal resistance
K1 envelop tracking
K1 predistortion
K1 FEM
SP 16
OP 23
LK http://dx.doi.org/https://doi.org/10.1109/BCICTS54660.2023.10310879
DO https://doi.org/10.1109/BCICTS54660.2023.10310879
SF ELIB - SuUB Bremen

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