I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
A Physics-Informed Pattern Recognition Method for Open-Circ..:
, In:
IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society
,
Zeng, Yu
;
Pou, Josep
;
Jie, Huamin
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IECON51785.2023.10311617
RT T1 <cTitle>IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>A Physics-Informed Pattern Recognition Method for Open-Circuit Fault Detection of Inverters Under Unexpected Conditions</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10311617&Exemplar=1&LAN=DE A1 Zeng, Yu A1 Pou, Josep A1 Jie, Huamin A1 Dong, Jiaxin A1 Ruan, Hebin A1 Kotturu, Janardhana A1 Cupelli, Marco A1 Kumar Gupta, Amit YR 2023 SN 2577-1647 K1 Training K1 Industrial electronics K1 Fault diagnosis K1 Analytical models K1 Electric potential K1 Fault detection K1 Neurons K1 Inverters K1 Neural network K1 Open-circuit fault detection K1 Physics-informed pattern recognition (PIPR) SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IECON51785.2023.10311617 DO https://doi.org/10.1109/IECON51785.2023.10311617 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
