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Theorizing and Demonstrating Far-Field Leakage Magnetic Fie..:

, In: IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society,
Takashima, Kaito ; Imura, Takehiro ; Hori, Yoichi - p. 1-6 , 2023
Link: https://doi.org/10.1109/IECON51785.2023.10311792