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1 Ergebnisse
1
Guided Reinforce Learning Through Spatial Residual Value fo..:
, In:
IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society
,
Wang, Zefei
;
Chen, Yi
;
Liu, Chenlu
.. - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IECON51785.2023.10312036
RT T1 <cTitle>IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>Guided Reinforce Learning Through Spatial Residual Value for Online 3D Bin Packing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10312036&Exemplar=1&LAN=DE A1 Wang, Zefei A1 Chen, Yi A1 Liu, Chenlu A1 Lin, Weiyang A1 Yang, Liu YR 2023 SN 2577-1647 K1 Training K1 Learning systems K1 Industrial electronics K1 Deep learning K1 Three-dimensional displays K1 Filtering K1 Heuristic algorithms K1 Online 3D bin packing K1 DRL K1 Palletization SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IECON51785.2023.10312036 DO https://doi.org/10.1109/IECON51785.2023.10312036 SF ELIB - SuUB Bremen
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