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1 Ergebnisse
1
Analysis of DAB Dead-Time Effect Based on Extended-Phase-Sh..:
, In:
IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society
,
Gao, Shanshan
;
Zhang, Yixue
;
Wang, Yijie
.. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IECON51785.2023.10312194
RT T1
IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society
: T1
Analysis of DAB Dead-Time Effect Based on Extended-Phase-Shift Control
UL https://suche.suub.uni-bremen.de/peid=ieee-10312194&Exemplar=1&LAN=DE A1 Gao, Shanshan A1 Zhang, Yixue A1 Wang, Yijie A1 Xu, Dianguo A1 Wang, Wei YR 2023 SN 2577-1647 K1 Industrial electronics K1 Power system measurements K1 Density measurement K1 Switching frequency K1 Simulation K1 Power quality K1 Soft switching K1 Dual active bridge K1 EPS control K1 dead-time effect K1 recessive-dead-time mode SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IECON51785.2023.10312194 DO https://doi.org/10.1109/IECON51785.2023.10312194 SF ELIB - SuUB Bremen
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