I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Background-Adaptive Surface Defect Detection Neural Network..:

, In: IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society,
Niu, Tongzhi ; Chen, Biao ; Wang, Zhenrong.. - p. 01-09 , 2023
Link: https://doi.org/10.1109/IECON51785.2023.10312239