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DSE-VAE: an Interpretable Fault Data Generation Method for ..:

, In: IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society,
Peng, Tao ; Peng, Xia ; Yang, Chao.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/IECON51785.2023.10312410