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1 Ergebnisse
1
Uncovering hidden vulnerabilities in CNNs through evolution..:
, In:
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
,
Turco, V.
;
Ruospo, A.
;
Gavarini, G.
.. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/DFT59622.2023.10313530
RT T1 <cTitle>2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)</cTitle>: T1 <Title>Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10313530&Exemplar=1&LAN=DE A1 Turco, V. A1 Ruospo, A. A1 Gavarini, G. A1 Sanchez, E. A1 Reorda, M. Sonza YR 2023 SN 2765-933X K1 Fault tolerance K1 Fault tolerant systems K1 Evolutionary computation K1 Very large scale integration K1 Libraries K1 Safety K1 Convolutional neural networks K1 Deep Neural Networks K1 Reliability K1 On-line Self-test K1 Fault Injection K1 Functional Safety SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/DFT59622.2023.10313530 DO https://doi.org/10.1109/DFT59622.2023.10313530 SF ELIB - SuUB Bremen
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