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An Estimation Method of Defect Types Using Artificial Neura..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Ota, Natsuki ; Hosokawa, Toshinori ; Yamazaki, Koji.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/DFT59622.2023.10313540