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1 Ergebnisse
1
A Block Partitioning Method for Region Exhaustive Test to R..:
, In:
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
,
Mizota, Momona
;
Hosokawa, Toshinori
;
Yoshimura, Masayoshi
. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/DFT59622.2023.10313552
RT T1
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
: T1
A Block Partitioning Method for Region Exhaustive Test to Reduce the Number of Test Patterns and Improve Gate Exhaustive Fault Coverage
UL https://suche.suub.uni-bremen.de/peid=ieee-10313552&Exemplar=1&LAN=DE A1 Mizota, Momona A1 Hosokawa, Toshinori A1 Yoshimura, Masayoshi A1 Arai, Masayuki YR 2023 SN 2765-933X K1 Fault tolerance K1 Fault tolerant systems K1 Discrete Fourier transforms K1 Logic gates K1 Very large scale integration K1 Circuit faults K1 Test pattern generators K1 gate-exhaustive faults K1 multiple target test generation K1 region-exhaustive faults K1 block partitioning K1 untestable faults SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/DFT59622.2023.10313552 DO https://doi.org/10.1109/DFT59622.2023.10313552 SF ELIB - SuUB Bremen
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