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1 Ergebnisse
1
An Evaluation of Estimated Field Random Testability for Dat..:
, In:
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
,
Toyooka, Yudai
;
Watanabe, Haruki
;
Hosokawa, Toshinori
. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/DFT59622.2023.10313570
RT T1 <cTitle>2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)</cTitle>: T1 <Title>An Evaluation of Estimated Field Random Testability for Data Paths at Register Transfer Level Using Status Signal Sequences Based on k-Consecutive State Transitions for Field Testing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10313570&Exemplar=1&LAN=DE A1 Toyooka, Yudai A1 Watanabe, Haruki A1 Hosokawa, Toshinori A1 Yoshimura, Masayoshi YR 2023 SN 2765-933X K1 Fault tolerance K1 Mission critical systems K1 Fault tolerant systems K1 Symbols K1 Built-in self-test K1 Very large scale integration K1 Logic gates K1 field testing K1 build-in self-test K1 non-scan design K1 structural symbol simulation K1 k-consecutive state transitions K1 estimated field random testability SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/DFT59622.2023.10313570 DO https://doi.org/10.1109/DFT59622.2023.10313570 SF ELIB - SuUB Bremen
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