I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Highly Efficient Layered Syndrome-based Double Error Correc..:
, In:
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
,
Dutta, Shruti
;
Rachamadugu Chinni, Sai Charan
;
Das, Abhishek
. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/DFT59622.2023.10313572
RT T1
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
: T1
Highly Efficient Layered Syndrome-based Double Error Correction Utilizing Current Summing in RRAM Cells to Simplify Decoder
UL https://suche.suub.uni-bremen.de/peid=ieee-10313572&Exemplar=1&LAN=DE A1 Dutta, Shruti A1 Rachamadugu Chinni, Sai Charan A1 Das, Abhishek A1 Touba, Nur A. YR 2023 SN 2765-933X K1 Resistive RAM K1 Neural networks K1 Symbols K1 Machine learning K1 Very large scale integration K1 Hardware K1 Error correction codes K1 Error Correcting Codes(ECC) K1 Double Error Correcting codes (DEC) K1 resistive RAM (RRAM) K1 Orthogonal Latin Square (OLS) K1 syndromes K1 soft errors SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/DFT59622.2023.10313572 DO https://doi.org/10.1109/DFT59622.2023.10313572 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)