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An Evaluation of a Testability Measure for State Assignment..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Hosokawa, Toshinori ; Iizuka, Kyohei ; Yoshimura, Masayoshi - p. 1-6 , 2023
Link: https://doi.org/10.1109/DFT59622.2023.10313575