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Understanding the Effect of Transpilation in the Reliabilit..:
, In:
2023 IEEE International Conference on Quantum Computing and Engineering (QCE)
,
Dilillo, Nicola
;
Giusto, Edoardo
;
Dri, Emanuele
... - p. 232-235 , 2023
Link:
https://doi.org/10.1109/QCE57702.2023.10220
RT T1 <cTitle>2023 IEEE International Conference on Quantum Computing and Engineering (QCE)</cTitle>: T1 <Title>Understanding the Effect of Transpilation in the Reliability of Quantum Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10313838&Exemplar=1&LAN=DE A1 Dilillo, Nicola A1 Giusto, Edoardo A1 Dri, Emanuele A1 Baheri, Betis A1 Guan, Qiang A1 Montrucchio, Bartolomeo A1 Rech, Paolo YR 2023 K1 Quantum algorithm K1 Program processors K1 Qubit K1 Logic gates K1 Reliability engineering K1 Topology K1 Circuit faults K1 Transpilation K1 Transient faults K1 Reliability K1 Co-Design SP 232 OP 235 LK http://dx.doi.org/https://doi.org/10.1109/QCE57702.2023.10220 DO https://doi.org/10.1109/QCE57702.2023.10220 SF ELIB - SuUB Bremen
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