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UTEMS: A Unit Testing Scheme for Event-driven Microservices:

, In: 2023 10th International Conference on Dependable Systems and Their Applications (DSA),
Ma, Shang-Pin ; Yang, Yu-Yung ; Lee, Shin-Jie. - p. 591-592 , 2023
Link: https://doi.org/10.1109/DSA59317.2023.00085