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1 Ergebnisse
1
D-Band Flip-Chip Packaging with Wafer-Level Cu-pillar Bumps:
, In:
2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
,
Cao, Zhibo
;
Stocchi, Matteo
;
Wipf, Christian
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/EPEPS58208.2023.10314877
RT T1
2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
: T1
D-Band Flip-Chip Packaging with Wafer-Level Cu-pillar Bumps
UL https://suche.suub.uni-bremen.de/peid=ieee-10314877&Exemplar=1&LAN=DE A1 Cao, Zhibo A1 Stocchi, Matteo A1 Wipf, Christian A1 Lehmann, Jens A1 Li, Lei A1 Wipf, Selin Tolunay A1 Wietstruck, Matthias A1 Carta, Corrado A1 Kaynak, Mehmet YR 2023 SN 2165-4115 K1 Radio frequency K1 Mass production K1 Insertion loss K1 Packaging K1 Throughput K1 Propagation losses K1 Flip-chip devices K1 Cu pillar K1 flip-chip K1 D-band K1 microstrip K1 FEM SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EPEPS58208.2023.10314877 DO https://doi.org/10.1109/EPEPS58208.2023.10314877 SF ELIB - SuUB Bremen
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