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A Computational Framework on Pinhole Damage in Ultrathin Ba..:

, In: 2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS),
Diyaroglu, Cagan ; Mohammadi Anaei, Mohammad Taghi ; Kim, Kyungjin - p. 1-3 , 2023
Link: https://doi.org/10.1109/EPEPS58208.2023.10314886