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1 Ergebnisse
1
PCB-level Jitter Sensitivity Measurement and Hierarchical P..:
, In:
2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
,
Ko, Youngjun
;
Song, Jinwook
;
Hong, Seokwoo
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EPEPS58208.2023.10314905
RT T1 <cTitle>2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)</cTitle>: T1 <Title>PCB-level Jitter Sensitivity Measurement and Hierarchical PDN-Z based PSIJ Estimation for PCIe Gen5 SSD</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10314905&Exemplar=1&LAN=DE A1 Ko, Youngjun A1 Song, Jinwook A1 Hong, Seokwoo A1 Kim, Hyunwoo A1 Jang, Chorom A1 Jin, Sungwoo A1 Roh, Sungwon A1 Lee, Jinan A1 Jeong, Jonghee A1 Kim, Kyungsuk A1 Park, Jonggyu YR 2023 SN 2165-4115 K1 Sensitivity K1 Voltage measurement K1 Power measurement K1 Power supplies K1 Estimation K1 Jitter K1 Predictive models K1 Jitter Sensitivity Function (JSF) K1 Peripheral Component Interconnect Express (PCIe) K1 Supply Noise (PSN) K1 Power Supply Noise Induced Jitter (PSIJ) K1 Solid State Drive (SSD) SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EPEPS58208.2023.10314905 DO https://doi.org/10.1109/EPEPS58208.2023.10314905 SF ELIB - SuUB Bremen
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