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Performance Evaluation of YOLO Models for Automatic Crop an..:

, In: 2023 IEEE 33rd International Conference on Microelectronics (MIEL),
Stankovic, L. ; Nikolic, T. ; Talaska, T.. - p. 1-4 , 2023
Link: https://doi.org/10.1109/MIEL58498.2023.10315839