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Design and Characterization of 6T SRAM bitcell using 18nm F..:

, In: 2023 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics (DISCOVER),
Shastry, Vishwanath ; N, Thyagarajan ; Basavaraju, Dinakar. - p. 89-95 , 2023
Link: https://doi.org/10.1109/DISCOVER58830.2023.10316718