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Study on Reduction of Background Fringes for Defect Detecti..:

, In: 2023 Asia Pacific Signal and Information Processing Association Annual Summit and Conference (APSIPA ASC),
Wei, An-Chi ; Chang, Yi-Cheng ; Sze, Jyh-Rou - p. 2163-2167 , 2023
Link: https://doi.org/10.1109/APSIPAASC58517.2023.10317452