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MeLPUF: Memory-in-Logic PUF Structures for Low-Overhead IC ..:

, In: 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE),
Vega, Christopher ; Slpsk, Patanjali ; Paul, Shubhra Deb.. - p. 1-7 , 2023
Link: https://doi.org/10.1109/PAINE58317.2023.10317943