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1 Ergebnisse
1
Device Aware Diagnosis for Unique Defects in STT-MRAMs:
, In:
2023 IEEE 32nd Asian Test Symposium (ATS)
,
Aouichi, Ahmed
;
Yuan, Sicong
;
Fieback, Moritz
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ATS59501.2023.10317952
RT T1
2023 IEEE 32nd Asian Test Symposium (ATS)
: T1
Device Aware Diagnosis for Unique Defects in STT-MRAMs
UL https://suche.suub.uni-bremen.de/peid=ieee-10317952&Exemplar=1&LAN=DE A1 Aouichi, Ahmed A1 Yuan, Sicong A1 Fieback, Moritz A1 Rao, Siddharth A1 Kim, Woojin A1 Marinissen, Erik Jan A1 Couet, Sebastien A1 Taouil, Mottaqiallah A1 Hamdioui, Said YR 2023 SN 2377-5386 K1 Torque K1 Random access memory K1 Feature extraction K1 Junctions K1 Commercialization K1 Magnetic tunneling K1 STT-MRAM K1 unique defect K1 test K1 diagnosis K1 device-aware method SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ATS59501.2023.10317952 DO https://doi.org/10.1109/ATS59501.2023.10317952 SF ELIB - SuUB Bremen
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