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1
Experimental Characterization of Two-Photon Optical Beam In..:
, In:
2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)
,
Patton, Ryan J.
;
George, Anthony
;
Kimura, Adam
. - p. 1-5 , 2023
Link:
https://doi.org/10.1109/PAINE58317.2023.10317954
RT T1 <cTitle>2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)</cTitle>: T1 <Title>Experimental Characterization of Two-Photon Optical Beam Induced Current Imaging for Microelectronics Assurance</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10317954&Exemplar=1&LAN=DE A1 Patton, Ryan J. A1 George, Anthony A1 Kimura, Adam A1 McCue, Jamin YR 2023 K1 Image resolution K1 Costs K1 Sensitivity K1 Optical diffraction K1 System performance K1 Optical variables measurement K1 Optical imaging K1 Optical Beam Induced Current K1 Two-Photon Absorption K1 Post-Silicon Verification and Validation K1 Assurance K1 Microelectronics SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/PAINE58317.2023.10317954 DO https://doi.org/10.1109/PAINE58317.2023.10317954 SF ELIB - SuUB Bremen
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