I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Non-Destructive Hardware Trojan Circuit Screening by Backsi..:
, In:
2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)
,
Sakamoto, Junichi
;
Sakane, Hirofumi
;
Hori, Yohei
... - p. 1-7 , 2023
Link:
https://doi.org/10.1109/PAINE58317.2023.10317961
RT T1 <cTitle>2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)</cTitle>: T1 <Title>Non-Destructive Hardware Trojan Circuit Screening by Backside Near Infrared Imaging</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10317961&Exemplar=1&LAN=DE A1 Sakamoto, Junichi A1 Sakane, Hirofumi A1 Hori, Yohei A1 Kawamura, Shinichi A1 Hayashi, Yuichi A1 Nagata, Makoto YR 2023 K1 Integrated circuits K1 Scanning electron microscopy K1 Wires K1 Supply chains K1 Inspection K1 Hardware K1 Trojan horses K1 hardware Trojan K1 SEM K1 optical microscope K1 infrared K1 non-destructive SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/PAINE58317.2023.10317961 DO https://doi.org/10.1109/PAINE58317.2023.10317961 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
