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1
Investigating the Effect of Electromagnetic Fault Injection..:
, In:
2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)
,
Proulx, Alexandre
;
Thibodeau, Jacob
;
Bourgault, Bastien
... - p. 1-7 , 2023
Link:
https://doi.org/10.1109/PAINE58317.2023.10317982
RT T1 <cTitle>2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)</cTitle>: T1 <Title>Investigating the Effect of Electromagnetic Fault Injections on the Configuration Memory of SRAM-Based FPGA Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10317982&Exemplar=1&LAN=DE A1 Proulx, Alexandre A1 Thibodeau, Jacob A1 Bourgault, Bastien A1 Chouinard, Jean-Yves A1 Miled, Amine A1 Fortier, Paul YR 2023 K1 Performance evaluation K1 Fault diagnosis K1 Inspection K1 Fabrics K1 Registers K1 Security K1 Object recognition K1 FPGA K1 EMFI K1 SRAM K1 SEU K1 SET SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/PAINE58317.2023.10317982 DO https://doi.org/10.1109/PAINE58317.2023.10317982 SF ELIB - SuUB Bremen
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