I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

SOI pMOS drain leakage understanding based on TCAD and meas..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Bosch, D. ; Lheritier, P. ; Guyader, F.... - p. 65-68 , 2023
Link: https://doi.org/10.23919/SISPAD57422.2023.10319543