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Variability in Si/SiGe and Si/SiO2 Spin Qubits due to Inter..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Cvitkovich, L. ; Sklenard, B. ; Waldhor, D.... - p. 341-344 , 2023
Link: https://doi.org/10.23919/SISPAD57422.2023.10319618